3D Image Visualization, Analysis & Model Generation for Materials Applications with Simpleware

Date/time: Thursday July 30th, 10am-12:00

Room: 3008 Calit2 building

Abstract:  3D Image Visualization, Analysis & Model Generation for Materials Applications with Simpleware

This technical seminar is aimed at those interested in visualizing, measuring and meshing of 3D image data to generate 3D Printing, CAD & Finite Element models for leading solvers.  We will demonstrate the ease of obtaining high fidelity meshes from 3D image data, discuss new features of the latest version, and will show the workflow of processing and meshing image data for a variety of applications.

CHEMS seminar on HAADF-STEM tomography of Au particles on silica supports

Date/Time: Monday, Dec 8, 11:00 am – 12:00 pm

Venue: ET 331

Presenter: Dr. Paromita Kundu

From External Morphology to Atomic Structure under the Electron Microscope

Paromita Kundua,b,c, Stuart Turnera, Hamed Heidaria, Sandra Van Aerta, Sara Balsa, N. Ravishankarb and Gustaaf Van Tendelooa

a Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171,  2020 Antwerp, Belgium

b Materials Research Center, Indian Institute of Science, Bangalore 560012, India

c Institute of Bioelectronics (PGI-8), Forschungszentrum Jülich, D – 52425 Jülich, Germany

E-mail: paro.124@gmail.com

Abstract: Analysing the external shape and internal arrangement of a nanostructured material can lead us to understand its behaviour and tune its properties. Advanced electron microscopy emerged as a powerful technique to quantify these aspects of a nanostructure.

HRTEM combined with image simulation and exit wave reconstruction can provide information on the local atomic structure, however, with aberration corrected microscopes and advanced analytical methods one can analyse the structure with picometer precision. This method is limited to atomically thin samples. Besides, electron tomography provides a way to reconstruct the 3D volume of the specimen from a series of 2D projection images. In case of nanoscale heterostructures electron tomography is a promising technique to understand the ordering of the heterounits whether the mixing is at atomic level or at the nanoscale.  It allows us to visualize the external morphology as well as derive the real atomic constitution of the nanostructure in 3D using (HR)STEM images taken at a series of tilt angles and from different zone axes, respectively. Here we demonstrate the case of  nanoscale heterostructures and 1D metal wires where HAADF-STEM tomography and aberration corrected high resolution microscopy are used to understand the structure and morphology. We investigated ultrathin gold nanowires to deduce its atomic structure using low dose microscopy and recorded beam induced structural changes at the atomic scale using aberration corrected HRTEM. This shows a relaxed structure extending towards the surface meaning a relatively large strain in the outermost layer of atoms indicating its potential for an efficient catalytic material. At higher dose we observe the dynamics of the atomic columns leading to the breaking of the wires. Other than the atomic structures, in nanohybrids the external combination of the building units is important to characterise as this influences its properties. HAADF-STEM electron tomography on Au-SiO2 spheres will also be demonstrated. The material is a potential catalyst and the distribution of Au on silica will certainly influence its activity. A 3D reconstruction from a series of HAADF-STEM images renders the volume which shows that the Au is embedded in the outermost layer of the silica spheres. Tomography performed on the intermediate structures formed in the reaction medium reveals that initially a 3D self assembly of Au particles forms, which in the presence of silica precursors results in such spherical morphology. The thermal stability of the structures are investigated and tomography reveals a good stability of the structure, however, at high temperatures the Au particles migrate inside the matrix although the external shape of silica remains intact. Some of these results will be discussed in the presentation.

LEXI summer lectures

Hi, LEXI users and potential users:

I have scheduled 5 LEXI lectures in the end of Sept 2014. The details are listed below:

1)            Sept 22, 9am-10:30: SEM imaging and principles

2)            Sept 24, 9am-10:30: EDS composition analysis and principles

3)            Sept 25, 9am-10:30: FIB and advanced capabilities in SEM

4)            Sept 26, 9am-10:30: TEM instrument principles and Electron diffraction

5)            Sept 29, 9am-10:30: TEM imaging: diffraction contrast and phase contrast

The lecture room is 3008 Calit2 Building. It is free to attend these lectures.

The goals of these lectures are to help LEXI users or potential users understand the capabilities and principles of LEXI SEMs and TEM, obtain high quality data and explain the data.

If you are interested in attending these lectures, please sign up in the Google doc using the link https://docs.google.com/spreadsheet/ccc?key=0AlVa2cfmNf6XdE1mZVNzT0JRT0lzSlk5X1R3b2VjTmc#gid=0

You are welcome to forward this message to other people who may be interested in.

Thanks,

Jian-Guo

Nanoscience Inc presentation and demos

Dear LEXI users,

You are invited to attend a presentation of easy-to-use instruments for micro- to nanoscale materials visualization & characterization.  The event will take place on Monday, August 18 at 1:00 pm in the Calit2 Building, Room 3008.  Seating is limited, so please sign up in advance by using the link: https://docs.google.com/spreadsheet/ccc?key=0AlVa2cfmNf6XdHNNd1ZEMHNlZ2VGVnRFcjFnVDlYM3c#gid=0 Following the presentation, instrument demonstrations and refreshments will be offered until 6:00 pm.  If you have a sample that you wish to have analyzed, you may be invited to take part in one-on-one time during the remainder of the week.  Time slots are limited, so please indicate in the above link that you are interested in the one-on-one session. You will be contacted later. There will be three instruments on site. Here is their information copied from Nanoscience Instruments document: “Phenom Desktop Scanning Electron Microscope The world’s best desktop SEM provides unmatched image clarity and resolution. The Phenom SEM is fast & easy to use. It is the only vibration insensitive SEM. Advanced capabilities include elemental analysis (EDS/EDX), elemental mapping, 3D surface roughness reconstruction and fiber/pore/particle analysis.  For biological or wet samples, a temperature control sample holder, based on the Peltier principle, is also available. Zeta 3D Optical Profiler An innovative 3D optical profiling system for fast, non-contact, true-color imaging and quantitative analysis. High aspect ratio features, high roughness surfaces, and high and low reflectivity samples can be measured. Advanced features include reflectometry, interferometry and automated mapping & defect analysis. Atomic Force Microscopes Our AFMs are easy to use and include a variety of imaging modes. The FlexAFM and new C3000 controller excel at imaging in air and liquid and feature a scanner that is linear, flat and fast. Check out our new traxAFM, a portable all-in-one AFM. Micromechanical Testers & Manipulators Micro/nano-mechanical testing & manipulation tools are employed for diverse applications in both air and vacuum, e.g. MEMS testing, force sensing, compression & tensile testing, pick and place operations, electrical probing, and more. For additional product and application information, please see:  www.nanoscience.com. “

Thank you for your time and consideration. Sincerely, Dr. Jian-Guo Zheng

Instrumentation Overview: Monday, August 18th, 1:00 2:00 pm in Room #3008, Followed by demonstrations in Room #3414

Have Your Samples Analyzed: Tues, Aug. 19 Thurs, Aug. 21, Preregistration Is required. Please contact us to reserve your time slot.

RSVP to Joe Grech, 77jgrech@nanoscience.com

 

Thermo Scientific Spectroscopic Imaging Workshop on 8/20/2014

Dear LEXI users:

Thermo Scientific Spectroscopic Imaging Workshop hosted by LEXI will be held in room 3008 Calit2 on August 20th, 2014. This whole day workshop is free with lunch provided. As the world leader in spectroscopy, engineers from Thermo Scientific will show you some of advanced imaging tools including New DXRxi Raman Imaging Microscope, the iN10 Infrared Imaging Microscope and System 7 Microanalyzer with Quantitative Hyper-spectral Imaging. If you are interested in this workshop, please sign up using the link:

https://docs.google.com/spreadsheet/ccc?key=0AlVa2cfmNf6XdE5CcFRib3RYdFRDUUItVWVwNl80cHc&usp=drive_web#gid=0

Pre-registration is required. I am going to email the full workshop program and registration link only to those who sign up in the above good doc.

This is a good opportunity. I wish to see you there.

Best, Jian-Guo

Program:

8:30 –  9:00:      Coffee and Networking

9:00 –  9:30:      Spectroscopic Imaging Contrast

9:30 – 10:15:     Raman Imaging

10:15 – 11:00:   EDS Imaging in SEM /TEM

11:00 – 11:45:   Infrared Microscopy

12:00 – 12:45:   Lunch (provided)

13:00 –  15:30:  Break-out sessions

Group 1:   Live demo of the new DXRxi      Raman Microscope *

Group 2:   Live demo of the System 7 EDS System on FEI XL30 FE SEM *

_*Customer samples accepted for analysis, time permitting

If you have sign up in the google doc, you do not need to register again, otherwise you may

registrate using the link http://events.r20.constantcontact.com/register/event?oeidk=a07e9mwmcwe50f56941&llr=ovmdpirab

Location: 3008 CALIT2 Building, University of California, Irvine

For more information, contact:

Breanne Lopata (Raman, FT/IR, Near-IR & NMR), Breanne.lopata@thermofisher.com, 630-885-0276

Joe Robinson (Microanalysis & XPS), Joseph.c.robinson@thermofisher.com, 503-327-925

 

 

LEXI TEM lectures

To help LEXI users understand TEM literatures and operations, 4 lectures as listed below have been scheduled for Nov 14, 19, 21, 26. The lecture time is between 12:30 to 2pm. Lecture room is 1322 Calit2.
Here are the lecture titles:
Lecture1: TEM electron optics- principles and operations
Lecture2: Electron diffraction- principles and applications
Lecture3: TEM image contrast mechanisms
Lecture4: TEM specimen preparation by using FIB techniques

LEXI seminar: SEM Basic Concepts and Principles-FEI XL-30 FESEM

Dear SEM users:

Here is a notice about LEXI seminar:

Title : SEM Basic Concepts and Principles-FEI XL-30 FESEM
Time/date: 2pm-3pm, Jan 30, 2013
Venue: 3008 Calit2
Speaker: Jian-Guo Zheng

Abstract: This seminar aims to help new SEM users understand basic concepts and principles. Using FEI XL-30 FESEM as an example, this seminar is not limited to any particular SEM instrument. The correlation between operations and principles will be covered. This seminar will also illustrate some SEM applications.

If you want to attend this seminar and have not signed up, please visit the link below:
https://docs.google.com/spreadsheet/ccc?key=0AlVa2cfmNf6XdEEtMmZqUnk4Sm5fUU5FdzN6NWRxcmc#gid=0

I would appreciate it if you could forward this notice to anyone who might be interested in. It is free to attend this seminar.

Thanks,

Jian-Guo

LEXI seminar 2: LEXI seminar 2-Introduction to FEI Quanta 3D FEG Dualbeam System

The 2nd LEXI seminar about Quanta 3D FEG dualbeam system will be held on Sept 21 (2-3pm) in 3008 Calit2 building. If you have not signed up, here is the link to the sign-up page:
https://docs.google.com/spreadsheet/ccc?key=0AlVa2cfmNf6XdEEtMmZqUnk4Sm5fUU5FdzN6NWRxcmc#gid=0
See you on this Friday.
Jian-Guo Zheng