Magellan SEM: Low kV resolution improvement

Jian-Guo Zheng / March 5, 2014 / Instrument Status

I have asked FEI engineer to improve the image resolution at low kV (1kV). FEI engineer may reserve the instrument from time to time. Alignment was done today and an aperture was changed. I will test it later.

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One Reply to “Magellan SEM: Low kV resolution improvement”

Jian-Guo Zheng says:

March 6, 2014 at 9:18 am

FEI engineer will be back to change the electron gun from 3/17-19.

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